High resolution X-ray diffraction and topography for the characterization of advanced materials : a short course / by Bede Asia ; [lecturers, Brian Tanner, Tamzin Lafford, Qu Bo]. 2001.

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High resolution X-ray diffraction and topography for the characterization of advanced materials : a short course / by Bede Asia ; [lecturers, Brian Tanner, Tamzin Lafford, Qu Bo]. 2001.

http://www.worldcat.org/oclc/54804927

1 v. (various pagings) : ill. ; 31 cm.

Singapore Integrated Library Automation Services, SILAS

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SNAC Resource ID: 7681941

Singapore Integrated Library Automation Services, SILAS

Related Entities

There are 4 Entities related to this resource.

Tanner, B. K. (Brian Keith)

http://n2t.net/ark:/99166/w6h43b78 (person)

Bede Asia (Firm)

http://n2t.net/ark:/99166/w6sn5mhk (corporateBody)

Lafford, Tamzin

http://n2t.net/ark:/99166/w6b29fds (person)

Qu, Bo, 1923-....

http://n2t.net/ark:/99166/w6z33jp8 (person)